Total Internal Reflection Geometry: Exploiting Total Internal Reflection Geometry for Terahertz Devices and Enhanced Sample Characterization (Advanced Optical Materials 3/2020)
نویسندگان
چکیده
منابع مشابه
Total internal reflection holography for optical interconnections
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ژورنال
عنوان ژورنال: Advanced Optical Materials
سال: 2020
ISSN: 2195-1071,2195-1071
DOI: 10.1002/adom.202070012